车规AEC--Q100测试流程（汽车电子）
2024-08-16 15:33:54 0 举报
1.该流程描述了AEC-Q100的测试流程。 2.AEC-Q100-STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS，是一个集成电路的应力测试鉴定标准规范，通过应力试验, 验证IC器件的质量与可靠性。
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大纲/内容
TEST GROUP E
Package Assembly
Bonding wire Strength Reliablity
Die Design
Device/Wafer leverl Reliability
HCI
LI
Functional/Parametric Electrical Verification Test
DROP
PC
TEST GROUP C
IWV
GFL
ELFR
Environmental Reliablity
Wafer Fabrication
TDDB
TEST GROUP F
SC
TC
EDR
SBS
Test @Hot
ED
TEST GROUP G
ESD Testing Reliablity
Test @Room&Hot
EMC
WBS
THB or HAST
WBP
Test @Room& Hot
SER
Test @Room
CHAR
TEST GROUP B
Defect Screening
SBA
HBM/MM
EM
LT
HTSL
Test @Room&Hot
Test@Room
External Visual
TEST GROUP D
Transportation Testing Reliablity
NBTI
PAT
ACorUHST
FG
HTOL
PD
SD
MS
Dynamic Testing Reliablity Accelerated Life Time Test
TEST GROUP A
LU
CA
SM
PTC
VFV
CDM
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